Institut Kejuruteraan Nano Elektronik

Universiti Malaysia Perlis

  • Facebook
  • Instagram
  • Twitter
  • YouTube
  • Tentang Kami
    • Latar Belakang
    • Misi dan Visi
    • Organisasi
    • Piagam Pelanggan
    • Video Korporat
    • Kepakaran Kami
    • Pengakuan
    • Brosur
  • Ahli akademik
    • Sarjana Sains
    • Doktor Falsafah
    • Pelajar Pascasiswazah
    • Alumni
  • Penyelidikan
    • Aktiviti Penyelidikan
      • Bidang Penyelidikan
      • Fokus Penyelidikan
      • Projek Penyelidikan
        • Produk
      • Kerjasama
      • Penerbitan
        • Papan skor
    • Kemudahan Penyelidikan
  • Hubungi Kami
    • Direktori Kakitangan
    • Maklum balas
  • Galeri
    • Video
    • Audio
  • Muat turun
    • Arkib
    • Penerbitan
    • Borang
    • Kesedaran OBE
    • Laporan
  • Pautan Pantas
    • Pautan Sokongan
    • Soalan Lazim
    • Peta Laman
    • Fakulti
    • Jabatan Lain
    • Acara

Archives for March 2016

Lectures Series at University of Djillali Liabes, Algeria

March 24, 2016 Oleh Editor

Filed Under: Events

Optical measurements on tailored zinc oxide thin films under optimal

March 24, 2016 Oleh Editor

Abstract – ZnO is synthesized by using conventional chemical route which is known as the “sol-gel” method and deposited on glass and silicon substrate. Morphological and optical properties have been investigated using XRD, AFM, FESEM and UV-vis test. In order to optimize the synthesized ZnO thin film, the ZnO thin film is coated with thin film of different thickness associated with various annealing temperature. Thicknesses of ZnO thin film coated for 3, 5 and 9 coating cycles of coating are 40 nm2, 60 nm2 and 200 nm2, respectively. The data report that the grain size of the seed solution increases from 80 nm to 110 nm as the thickness of ZnO thin film increases. As the thin film is treated with annealing temperature from 200°C to 450°C, the grain size of thin film also increases from 100 nm2 to 450 nm2. The RMS value of thin film also increases due to intense surface roughness on ZnO thin film. The band gap value of thin film decreased from 3.26 eV to 3.18 eV for coating ZnO thin film with thickness 40 nm2-200 nm2.

Keywords – Band gap, Grain size, Thin film, UV-vis, XRD, ZnO

Penulis Berkaitan: Uda Hashim
Emel Pengarang Berkaitan: uda@unimap.edu.my

Teks penuh: PDF

Filed Under: Publications Tagged With: Band gap, Grain size, Thin film, UV-vis, XRD, ZnO

BERITA @ INEE

  • IJNeaM Achieves a JCR Impact Factor of 0.8
  • Taklimat Hala Tuju Penyelidikan oleh Timbalan Naib Canselor Penyelidikan & Inovasi (TNC P&I) dan Pencapaian INEE 2022-2025
  • Sentuhan Kasih INEE 2026M/1447H
  • Program Cahaya Prihatin: Elektrik Untuk Masyarakat 2025
  • Persidangan Antarabangsa ke-2 mengenai Nanoteknologi & Penyelidikan Bahan (ICONMAR 2025)

ACARA & AKTIVITI

  • Lawatan daripada Fakulti Teknologi Lanjutan dan Pelbagai Disiplin (FTMM), Universitas Airlangga
  • Lawatan daripada Syarikat Aromaticroot
  • Panggilan untuk Kertas Kerja: BOND21 2026
  • Lawatan oleh Pelajar SJK (C) Nan Kwang
  • Jelajah INEE Nano – Siri 4
Dasar Privasi | Dasar Keselamatan | Penafian | Peta Laman | Soalan Lazim | Maklum balas | Panduan Pengguna | Muat turun | Siswazah

Institut Kejuruteraan Nano Elektronik, Universiti Malaysia Perlis
Lot 106, 108 & 110, Blok A, Taman Pertiwi Indah,
Jalan Kangar-Alor Setar, Seriab 01000 Kangar, Perlis, Malaysia
Tel: +604-979 8581 Faks: +604-979 8578 Emel: webmaster.inee@unimap.edu.my

Hak Cipta © INEE UniMAP

  • Facebook
  • Instagram
  • Twitter
  • YouTube

Untuk paparan terbaik, sila gunakan versi terkini Internet Explorer, Mozilla Firefox dan Google Chrome dengan resolusi 1280 x 768 dan ke atas.

Rakan Kongsi BioNexus (BNP)

QS 5 Bintang

myGov

Logo UniMAP

Designed by Mohd Isa from Portal Kerjaya & Sumber Rujukan Malaysia

  • English